TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_43_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-009-01 | FUSED_ID : 6359364768390754449
  IC_TEMP :  -52.00 | VDDM : 1124.93 | AUX_INT :   -7.75 | CsaBias :   71.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08083e-03 / 2
  ADC_P0  : -7.75252e-03 ± 2.23069e-02
  ADC_P1  : 7.99381e-03 ± 5.35910e-04
  ADC_P2  : -4.42683e-06 ± 2.56250e-06
  CSA_Chi2/NDF : 1.12398e-04 / 2
  CSA_P0  : 5.90435e-02 ± 7.07135e-03
  CSA_P1  : 9.97479e-03 ± 5.32775e-04
  CSA_P2  : -4.79954e-05 ± 8.11354e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [28, 51, 105, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [12, 21, 29, 42, 45, 59, 92, 103, 114, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4416', '1.800', '0.1375', '1.800', '0.0926', '7.000', '0.7072', 1, 1, 1, 1, 1725018214.781764]
VI_after__Init : ['1.201', '0.4419', '1.800', '0.1376', '1.799', '0.0874', '7.000', '0.7072', 1, 1, 1, 1, 1725018222.735216]
VI_at__the_End : ['1.201', '0.4932', '1.800', '0.1393', '1.800', '0.1123', '7.000', '0.7078', 1, 1, 1, 1, 1725018285.19556]