TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_33_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-015-01 | FUSED_ID : 6359364768390754545
  IC_TEMP :  -59.79 | VDDM : 1122.69 | AUX_INT :  -10.26 | CsaBias :   74.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63207e-03 / 2
  ADC_P0  : -1.02618e-02 ± 2.73992e-02
  ADC_P1  : 8.48998e-03 ± 6.79188e-04
  ADC_P2  : -5.64115e-06 ± 3.36845e-06
  CSA_Chi2/NDF : 1.56497e-04 / 2
  CSA_P0  : 6.02317e-02 ± 8.34401e-03
  CSA_P1  : 1.03498e-02 ± 6.28661e-04
  CSA_P2  : -5.68494e-05 ± 9.57376e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [5, 16, 64, 89, 93, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [14, 31, 66, 73, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2483', '1.800', '0.1549', '1.799', '0.0908', '7.000', '0.7085', 1, 1, 1, 1, 1725017636.462008]
VI_after__Init : ['1.201', '0.2482', '1.800', '0.1549', '1.801', '0.0842', '7.000', '0.7077', 1, 1, 1, 1, 1725017644.7703977]
VI_at__the_End : ['1.201', '0.4842', '1.800', '0.1397', '1.799', '0.1128', '7.000', '0.7082', 1, 1, 1, 1, 1725017704.4108303]