TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_30_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-017-06 | FUSED_ID : 6359364768390754582
  IC_TEMP :  -56.63 | VDDM : 1131.35 | AUX_INT :   -7.65 | CsaBias :   73.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39778e-03 / 2
  ADC_P0  : -7.65390e-03 ± 2.53991e-02
  ADC_P1  : 8.19285e-03 ± 6.24052e-04
  ADC_P2  : -4.89139e-06 ± 3.03816e-06
  CSA_Chi2/NDF : 1.43942e-04 / 2
  CSA_P0  : 5.87545e-02 ± 8.00232e-03
  CSA_P1  : 1.02410e-02 ± 6.02917e-04
  CSA_P2  : -5.32353e-05 ± 9.18172e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 27, 35, 62, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [31, 47, 49, 100, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2138', '1.800', '0.2015', '1.800', '0.0878', '7.000', '0.7078', 1, 1, 1, 1, 1725017444.502285]
VI_after__Init : ['1.202', '0.2137', '1.800', '0.2015', '1.801', '0.0825', '7.000', '0.7076', 1, 1, 1, 1, 1725017453.47357]
VI_at__the_End : ['1.201', '0.4865', '1.800', '0.1404', '1.804', '0.1145', '7.000', '0.7084', 1, 1, 1, 1, 1725017517.444895]