TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_27_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-019-06 | FUSED_ID : 6359364768390754614
  IC_TEMP :  -67.34 | VDDM : 1111.15 | AUX_INT :   -7.94 | CsaBias :   52.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11436e-03 / 2
  ADC_P0  : -7.94332e-03 ± 2.26001e-02
  ADC_P1  : 8.68321e-03 ± 5.74547e-04
  ADC_P2  : -6.33141e-06 ± 2.89174e-06
  CSA_Chi2/NDF : 1.57955e-04 / 2
  CSA_P0  : 6.06511e-02 ± 8.38280e-03
  CSA_P1  : 1.01827e-02 ± 6.31584e-04
  CSA_P2  : -5.53570e-05 ± 9.61827e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [27, 47, 77, 122, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 23, 43, 93, 113, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3304', '1.800', '0.1493', '1.800', '0.0947', '7.000', '0.7088', 1, 1, 1, 1, 1725017251.7125247]
VI_after__Init : ['1.202', '0.3306', '1.800', '0.1494', '1.801', '0.0871', '7.000', '0.7079', 1, 1, 1, 1, 1725017259.9458246]
VI_at__the_End : ['1.202', '0.4777', '1.800', '0.1410', '1.802', '0.1156', '7.000', '0.7086', 1, 1, 1, 1, 1725017325.2279956]