TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_25_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-020-06 | FUSED_ID : 6359364768390754630
  IC_TEMP :  -56.98 | VDDM : 1124.68 | AUX_INT :   -7.57 | CsaBias :   78.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23940e-03 / 2
  ADC_P0  : -7.57066e-03 ± 2.39227e-02
  ADC_P1  : 7.86217e-03 ± 5.69279e-04
  ADC_P2  : -4.14258e-06 ± 2.69060e-06
  CSA_Chi2/NDF : 1.03060e-04 / 2
  CSA_P0  : 5.70181e-02 ± 6.77122e-03
  CSA_P1  : 9.40483e-03 ± 5.10163e-04
  CSA_P2  : -4.57379e-05 ± 7.76918e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [21, 28, 45, 54, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 14, 35, 39, 82, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1673', '1.800', '0.1387', '1.799', '0.0817', '7.000', '0.7078', 1, 1, 1, 1, 1725017155.0825744]
VI_after__Init : ['1.202', '0.1673', '1.800', '0.1387', '1.800', '0.0767', '7.000', '0.7077', 1, 1, 1, 1, 1725017163.2199614]
VI_at__the_End : ['1.201', '0.4627', '1.800', '0.1349', '1.804', '0.1149', '7.000', '0.7086', 1, 1, 1, 1, 1725017227.2473285]