TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_22_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-022-06 | FUSED_ID : 6359364768390754662
  IC_TEMP :  -62.66 | VDDM : 1099.92 | AUX_INT :   -9.09 | CsaBias :   58.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25288e-03 / 2
  ADC_P0  : -9.09085e-03 ± 2.39035e-02
  ADC_P1  : 8.47374e-03 ± 5.74795e-04
  ADC_P2  : -6.91748e-06 ± 2.73638e-06
  CSA_Chi2/NDF : 1.24698e-04 / 2
  CSA_P0  : 5.79322e-02 ± 7.44822e-03
  CSA_P1  : 9.75216e-03 ± 5.61170e-04
  CSA_P2  : -4.89280e-05 ± 8.54595e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 28, 39, 52, 87, 98, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [29, 32, 37, 38, 43, 63, 75, 77, 97, 119, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3120', '1.800', '0.1316', '1.799', '0.0901', '7.000', '0.7077', 1, 1, 1, 1, 1725016962.4944491]
VI_after__Init : ['1.202', '0.3132', '1.800', '0.1318', '1.800', '0.0850', '7.000', '0.7076', 1, 1, 1, 1, 1725016971.262886]
VI_at__the_End : ['1.202', '0.4741', '1.800', '0.1370', '1.804', '0.1143', '7.000', '0.7084', 1, 1, 1, 1, 1725017032.7654362]