TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_19_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-024-06 | FUSED_ID : 6359364768390754694
  IC_TEMP :  -62.04 | VDDM : 1124.15 | AUX_INT :   -9.65 | CsaBias :   64.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42738e-03 / 2
  ADC_P0  : -9.65226e-03 ± 2.55526e-02
  ADC_P1  : 8.34695e-03 ± 6.09320e-04
  ADC_P2  : -6.39359e-06 ± 2.88580e-06
  CSA_Chi2/NDF : 1.92887e-04 / 2
  CSA_P0  : 5.98283e-02 ± 9.26347e-03
  CSA_P1  : 1.03675e-02 ± 6.97936e-04
  CSA_P2  : -5.48233e-05 ± 1.06287e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 18, 19, 29, 30, 81, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [31, 33, 79, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3774', '1.800', '0.1339', '1.800', '0.0928', '7.000', '0.7077', 1, 1, 1, 1, 1725016769.9903235]
VI_after__Init : ['1.201', '0.3774', '1.800', '0.1337', '1.801', '0.0870', '7.000', '0.7077', 1, 1, 1, 1, 1725016778.9516375]
VI_at__the_End : ['1.201', '0.4885', '1.800', '0.1376', '1.803', '0.1146', '7.000', '0.7083', 1, 1, 1, 1, 1725016843.2829535]