TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_16_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-026-06 | FUSED_ID : 6359364768390754726
  IC_TEMP :  -54.21 | VDDM : 1126.12 | AUX_INT :   -9.13 | CsaBias :   63.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43992e-03 / 2
  ADC_P0  : -9.13158e-03 ± 2.57394e-02
  ADC_P1  : 8.13452e-03 ± 6.15157e-04
  ADC_P2  : -5.22773e-06 ± 2.92524e-06
  CSA_Chi2/NDF : 1.10960e-04 / 2
  CSA_P0  : 5.82187e-02 ± 7.02595e-03
  CSA_P1  : 9.51909e-03 ± 5.29354e-04
  CSA_P2  : -4.15767e-05 ± 8.06144e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 31, 50, 76, 90, 100, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [14, 31, 43, 44, 47, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2433', '1.800', '0.1699', '1.800', '0.0851', '7.000', '0.7074', 1, 1, 1, 1, 1725016578.2414923]
VI_after__Init : ['1.202', '0.2435', '1.800', '0.1699', '1.800', '0.0797', '7.000', '0.7073', 1, 1, 1, 1, 1725016586.2760558]
VI_at__the_End : ['1.201', '0.4886', '1.800', '0.1324', '1.804', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1725016646.7299318]