TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_00_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-005-09 | FUSED_ID : 6359364768390758489
  IC_TEMP :  -58.52 | VDDM : 1125.09 | AUX_INT :   -8.96 | CsaBias :   66.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35103e-03 / 2
  ADC_P0  : -8.96141e-03 ± 2.48867e-02
  ADC_P1  : 8.44978e-03 ± 6.08852e-04
  ADC_P2  : -6.22203e-06 ± 2.95522e-06
  CSA_Chi2/NDF : 1.74922e-04 / 2
  CSA_P0  : 5.79224e-02 ± 8.82154e-03
  CSA_P1  : 1.02636e-02 ± 6.64640e-04
  CSA_P2  : -5.32811e-05 ± 1.01217e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [6, 21, 24, 31, 43, 59, 62, 95, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [20, 45, 65, 92, 98, 100, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4880', '1.800', '0.1462', '1.800', '0.0409', '7.000', '0.7052', 1, 1, 1, 1, 1725019255.657984]
VI_after__Init : ['1.202', '0.4887', '1.800', '0.1463', '1.800', '0.0931', '7.000', '0.7070', 1, 1, 1, 1, 1725019263.6773577]
VI_at__the_End : ['1.202', '0.4909', '1.800', '0.1395', '1.800', '0.1140', '7.000', '0.7079', 1, 1, 1, 1, 1725019323.2765782]