TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_02_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-006-09 | FUSED_ID : 6359364768390758505
  IC_TEMP :  -52.10 | VDDM : 1126.70 | AUX_INT :   -9.26 | CsaBias :   80.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42279e-03 / 2
  ADC_P0  : -9.25589e-03 ± 2.56108e-02
  ADC_P1  : 8.24489e-03 ± 6.28728e-04
  ADC_P2  : -4.78145e-06 ± 3.08438e-06
  CSA_Chi2/NDF : 1.48229e-04 / 2
  CSA_P0  : 5.89910e-02 ± 8.12061e-03
  CSA_P1  : 1.01872e-02 ± 6.11830e-04
  CSA_P2  : -5.05919e-05 ± 9.31744e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [19, 37, 38, 46, 77, 91, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [58, 80, 97, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2183', '1.800', '0.1554', '1.800', '0.0861', '7.000', '0.7082', 1, 1, 1, 1, 1725019351.891207]
VI_after__Init : ['1.202', '0.2187', '1.800', '0.1554', '1.800', '0.0788', '7.000', '0.7072', 1, 1, 1, 1, 1725019360.0255058]
VI_at__the_End : ['1.201', '0.4932', '1.800', '0.1393', '1.800', '0.1129', '7.000', '0.7081', 1, 1, 1, 1, 1725019426.0031579]