TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_04_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-007-09 | FUSED_ID : 6359364768390758521
  IC_TEMP :  -58.07 | VDDM : 1123.33 | AUX_INT :   -7.35 | CsaBias :   75.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18891e-03 / 2
  ADC_P0  : -7.35323e-03 ± 2.33988e-02
  ADC_P1  : 8.31163e-03 ± 5.81796e-04
  ADC_P2  : -5.15816e-06 ± 2.86366e-06
  CSA_Chi2/NDF : 1.63051e-04 / 2
  CSA_P0  : 6.36658e-02 ± 8.51694e-03
  CSA_P1  : 1.04143e-02 ± 6.41690e-04
  CSA_P2  : -5.38328e-05 ± 9.77218e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 11, 36, 41, 56, 63, 68]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 53, 108, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1831', '1.800', '0.1302', '1.800', '0.0877', '7.000', '0.7073', 1, 1, 1, 1, 1725019448.2473898]
VI_after__Init : ['1.202', '0.1832', '1.800', '0.1301', '1.800', '0.0818', '7.000', '0.7071', 1, 1, 1, 1, 1725019456.383669]
VI_at__the_End : ['1.202', '0.5016', '1.800', '0.1399', '1.800', '0.1132', '7.000', '0.7083', 1, 1, 1, 1, 1725019523.3903084]