TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_05_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-008-09 | FUSED_ID : 6359364768390758537
  IC_TEMP :  -53.88 | VDDM : 1137.17 | AUX_INT :   -7.65 | CsaBias :   61.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.42480e-04 / 2
  ADC_P0  : -7.65072e-03 ± 2.07515e-02
  ADC_P1  : 8.64919e-03 ± 5.22770e-04
  ADC_P2  : -6.48195e-06 ± 2.60609e-06
  CSA_Chi2/NDF : 1.33222e-04 / 2
  CSA_P0  : 6.21864e-02 ± 7.69857e-03
  CSA_P1  : 9.88944e-03 ± 5.80031e-04
  CSA_P2  : -4.55916e-05 ± 8.83319e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [5, 72, 95, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [14, 19]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4473', '1.800', '0.1416', '1.800', '0.0973', '7.000', '0.7074', 1, 1, 1, 1, 1725019544.841581]
VI_after__Init : ['1.201', '0.4473', '1.800', '0.1416', '1.800', '0.0915', '7.000', '0.7075', 1, 1, 1, 1, 1725019552.9069378]
VI_at__the_End : ['1.201', '0.4995', '1.800', '0.1412', '1.800', '0.1127', '7.000', '0.7082', 1, 1, 1, 1, 1725019617.4406805]