TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_07_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-009-09 | FUSED_ID : 6359364768390758553
  IC_TEMP :  -52.16 | VDDM : 1107.09 | AUX_INT :   -7.54 | CsaBias :   75.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03354e-03 / 2
  ADC_P0  : -7.54445e-03 ± 2.17669e-02
  ADC_P1  : 8.32387e-03 ± 5.33580e-04
  ADC_P2  : -5.65827e-06 ± 2.58998e-06
  CSA_Chi2/NDF : 1.46486e-04 / 2
  CSA_P0  : 5.91087e-02 ± 8.07274e-03
  CSA_P1  : 9.98859e-03 ± 6.08223e-04
  CSA_P2  : -4.81305e-05 ± 9.26251e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [12, 41, 51, 89, 103, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [88, 92, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2506', '1.800', '0.1580', '1.800', '0.0844', '7.000', '0.7075', 1, 1, 1, 1, 1725019641.1969159]
VI_after__Init : ['1.202', '0.2504', '1.800', '0.1579', '1.799', '0.0798', '7.000', '0.7076', 1, 1, 1, 1, 1725019649.296212]
VI_at__the_End : ['1.202', '0.4954', '1.800', '0.1384', '1.801', '0.1118', '7.000', '0.7081', 1, 1, 1, 1, 1725019716.3268373]