TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_08_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-010-09 | FUSED_ID : 6359364768390758569
  IC_TEMP :  -54.90 | VDDM : 1123.32 | AUX_INT :   -9.26 | CsaBias :   63.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42731e-03 / 2
  ADC_P0  : -9.26052e-03 ± 2.56341e-02
  ADC_P1  : 8.12029e-03 ± 6.14596e-04
  ADC_P2  : -4.97324e-06 ± 2.93866e-06
  CSA_Chi2/NDF : 1.55648e-04 / 2
  CSA_P0  : 6.07972e-02 ± 8.32135e-03
  CSA_P1  : 1.02598e-02 ± 6.26954e-04
  CSA_P2  : -5.21899e-05 ± 9.54776e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [16, 55, 59, 92, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [37, 61, 108, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4451', '1.800', '0.1507', '1.800', '0.1017', '7.000', '0.7075', 1, 1, 1, 1, 1725019737.6650758]
VI_after__Init : ['1.202', '0.4453', '1.800', '0.1510', '1.800', '0.0958', '7.000', '0.7076', 1, 1, 1, 1, 1725019746.4223661]
VI_at__the_End : ['1.202', '0.4956', '1.800', '0.1393', '1.800', '0.1136', '7.000', '0.7084', 1, 1, 1, 1, 1725019812.7041934]