TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_10_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-011-09 | FUSED_ID : 6359364768390758585
  IC_TEMP :  -51.28 | VDDM : 1107.83 | AUX_INT :   -8.63 | CsaBias :   65.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27791e-03 / 2
  ADC_P0  : -8.62605e-03 ± 2.42138e-02
  ADC_P1  : 8.26083e-03 ± 5.83545e-04
  ADC_P2  : -5.74224e-06 ± 2.78928e-06
  CSA_Chi2/NDF : 1.25588e-04 / 2
  CSA_P0  : 6.01357e-02 ± 7.47475e-03
  CSA_P1  : 1.01300e-02 ± 5.63169e-04
  CSA_P2  : -4.92989e-05 ± 8.57639e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [34, 48, 56, 60, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 41, 49, 74, 92, 112, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4155', '1.800', '0.1629', '1.800', '0.0971', '7.000', '0.7076', 1, 1, 1, 1, 1725019833.5184658]
VI_after__Init : ['1.201', '0.4155', '1.800', '0.1630', '1.800', '0.0912', '7.000', '0.7075', 1, 1, 1, 1, 1725019842.240746]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1392', '1.799', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1725019901.2820902]