TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_12_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-012-09 | FUSED_ID : 6359364768390758601
  IC_TEMP :  -55.83 | VDDM : 1134.64 | AUX_INT :   -7.72 | CsaBias :   80.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85276e-04 / 2
  ADC_P0  : -7.72024e-03 ± 2.12388e-02
  ADC_P1  : 8.05166e-03 ± 5.00050e-04
  ADC_P2  : -5.45292e-06 ± 2.33334e-06
  CSA_Chi2/NDF : 1.07777e-04 / 2
  CSA_P0  : 6.03993e-02 ± 6.92445e-03
  CSA_P1  : 9.88256e-03 ± 5.21707e-04
  CSA_P2  : -4.66470e-05 ± 7.94498e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [13, 20, 45, 69, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [11, 38, 63, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4513', '1.800', '0.1425', '1.800', '0.1007', '7.000', '0.7076', 1, 1, 1, 1, 1725019929.9768817]
VI_after__Init : ['1.202', '0.4517', '1.800', '0.1425', '1.800', '0.0953', '7.000', '0.7076', 1, 1, 1, 1, 1725019938.8112533]
VI_at__the_End : ['1.202', '0.4942', '1.800', '0.1384', '1.800', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1725020003.143102]