TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_13_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-013-09 | FUSED_ID : 6359364768390758617
  IC_TEMP :  -53.25 | VDDM : 1114.08 | AUX_INT :   -6.52 | CsaBias :   69.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.24646e-04 / 2
  ADC_P0  : -6.51592e-03 ± 2.05412e-02
  ADC_P1  : 8.49557e-03 ± 5.05124e-04
  ADC_P2  : -6.54246e-06 ± 2.45340e-06
  CSA_Chi2/NDF : 1.37467e-04 / 2
  CSA_P0  : 6.04897e-02 ± 7.82028e-03
  CSA_P1  : 9.97700e-03 ± 5.89201e-04
  CSA_P2  : -4.66161e-05 ± 8.97284e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [9, 48, 56, 67, 75, 79, 103, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [13, 94, 105, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1705', '1.800', '0.1565', '1.800', '0.0842', '7.000', '0.7076', 1, 1, 1, 1, 1725020026.793157]
VI_after__Init : ['1.202', '0.1705', '1.800', '0.1565', '1.800', '0.0786', '7.000', '0.7076', 1, 1, 1, 1, 1725020035.0005035]
VI_at__the_End : ['1.202', '0.4998', '1.800', '0.1408', '1.800', '0.1131', '7.000', '0.7086', 1, 1, 1, 1, 1725020102.536168]