TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_16_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-015-09 | FUSED_ID : 6359364768390758649
  IC_TEMP :  -52.90 | VDDM : 1126.65 | AUX_INT :   -7.14 | CsaBias :   73.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.03873e-04 / 2
  ADC_P0  : -7.13513e-03 ± 2.03703e-02
  ADC_P1  : 8.12981e-03 ± 4.93481e-04
  ADC_P2  : -4.98422e-06 ± 2.37188e-06
  CSA_Chi2/NDF : 1.31333e-04 / 2
  CSA_P0  : 5.93732e-02 ± 7.64379e-03
  CSA_P1  : 9.95652e-03 ± 5.75905e-04
  CSA_P2  : -4.83453e-05 ± 8.77035e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [43, 56, 60, 76, 96, 100, 106, 121, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [29, 62, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1974', '1.800', '0.1620', '1.800', '0.0857', '7.000', '0.7080', 1, 1, 1, 1, 1725020219.5338953]
VI_after__Init : ['1.202', '0.1974', '1.800', '0.1620', '1.800', '0.0800', '7.000', '0.7079', 1, 1, 1, 1, 1725020227.6473007]
VI_at__the_End : ['1.202', '0.4908', '1.800', '0.1390', '1.805', '0.1124', '7.000', '0.7085', 1, 1, 1, 1, 1725020287.220649]