TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_20_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-017-14 | FUSED_ID : 6359364768390758686
  IC_TEMP :  -57.10 | VDDM : 1129.36 | AUX_INT :   -8.02 | CsaBias :   68.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04579e-03 / 2
  ADC_P0  : -8.01559e-03 ± 2.18932e-02
  ADC_P1  : 8.51860e-03 ± 5.46741e-04
  ADC_P2  : -5.94095e-06 ± 2.71090e-06
  CSA_Chi2/NDF : 1.52793e-04 / 2
  CSA_P0  : 6.01834e-02 ± 8.24467e-03
  CSA_P1  : 1.05672e-02 ± 6.21177e-04
  CSA_P2  : -5.73540e-05 ± 9.45979e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 28, 31, 58, 80, 103, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 12, 76, 79, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3109', '1.800', '0.1950', '1.800', '0.0950', '7.000', '0.7088', 1, 1, 1, 1, 1725020411.9827843]
VI_after__Init : ['1.201', '0.3108', '1.800', '0.1950', '1.799', '0.0874', '7.000', '0.7076', 1, 1, 1, 1, 1725020420.8810647]
VI_at__the_End : ['1.202', '0.4942', '1.800', '0.1436', '1.800', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1725020480.6853259]