TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_21_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-018-14 | FUSED_ID : 6359364768390758702
  IC_TEMP :  -54.35 | VDDM : 1129.14 | AUX_INT :   -7.19 | CsaBias :   69.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.60601e-04 / 2
  ADC_P0  : -7.19059e-03 ± 1.98517e-02
  ADC_P1  : 8.58350e-03 ± 5.04609e-04
  ADC_P2  : -5.80512e-06 ± 2.54227e-06
  CSA_Chi2/NDF : 1.46108e-04 / 2
  CSA_P0  : 6.08871e-02 ± 8.06231e-03
  CSA_P1  : 1.05957e-02 ± 6.07437e-04
  CSA_P2  : -5.41315e-05 ± 9.25055e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [81, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [12, 28, 33, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2463', '1.800', '0.1764', '1.800', '0.0938', '7.000', '0.7077', 1, 1, 1, 1, 1725020508.5602171]
VI_after__Init : ['1.202', '0.2463', '1.800', '0.1764', '1.800', '0.0884', '7.000', '0.7076', 1, 1, 1, 1, 1725020517.3785267]
VI_at__the_End : ['1.202', '0.5093', '1.800', '0.1420', '1.800', '0.1126', '7.000', '0.7081', 1, 1, 1, 1, 1725020575.5139768]