TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_23_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-019-14 | FUSED_ID : 6359364768390758718
  IC_TEMP :  -58.15 | VDDM : 1126.19 | AUX_INT :  -29.09 | CsaBias :   60.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.02857e-03 / 2
  ADC_P0  : -2.90869e-02 ± 3.17258e-02
  ADC_P1  : 9.01430e-03 ± 7.98739e-04
  ADC_P2  : -7.22000e-06 ± 4.00368e-06
  CSA_Chi2/NDF : 1.26983e-04 / 2
  CSA_P0  : 6.10986e-02 ± 7.51615e-03
  CSA_P1  : 1.00945e-02 ± 5.66287e-04
  CSA_P2  : -5.01286e-05 ± 8.62389e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [22, 28, 32]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 10, 44, 57, 67, 81, 88, 104, 107, 117, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1277', '1.800', '0.1589', '1.800', '0.0831', '7.000', '0.7080', 1, 1, 1, 1, 1725020605.3588977]
VI_after__Init : ['1.202', '0.1279', '1.800', '0.1588', '1.800', '0.0756', '7.000', '0.7073', 1, 1, 1, 1, 1725020613.3802733]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1396', '1.800', '0.1150', '7.000', '0.7083', 1, 1, 1, 1, 1725020681.0683608]