TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_25_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-020-14 | FUSED_ID : 6359364768390758734
  IC_TEMP :  -56.54 | VDDM : 1129.40 | AUX_INT :   -9.38 | CsaBias :   66.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27732e-03 / 2
  ADC_P0  : -9.38270e-03 ± 2.41432e-02
  ADC_P1  : 8.46952e-03 ± 5.82341e-04
  ADC_P2  : -6.70900e-06 ± 2.78744e-06
  CSA_Chi2/NDF : 9.55500e-05 / 2
  CSA_P0  : 6.01026e-02 ± 6.51985e-03
  CSA_P1  : 9.49828e-03 ± 4.91224e-04
  CSA_P2  : -4.10088e-05 ± 7.48076e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 12, 13, 17, 29, 60, 105, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [15, 16, 52, 59, 66, 67, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4815', '1.800', '0.1371', '1.800', '0.0940', '7.000', '0.7083', 1, 1, 1, 1, 1725020701.337821]
VI_after__Init : ['1.202', '0.4819', '1.800', '0.1372', '1.800', '0.0865', '7.000', '0.7072', 1, 1, 1, 1, 1725020709.4072294]
VI_at__the_End : ['1.202', '0.4923', '1.800', '0.1396', '1.804', '0.1122', '7.000', '0.7082', 1, 1, 1, 1, 1725020770.2497478]