TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_29_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-023-14 | FUSED_ID : 6359364768390758782
  IC_TEMP :  -54.34 | VDDM : 1125.52 | AUX_INT :   -8.69 | CsaBias :   73.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38713e-03 / 2
  ADC_P0  : -8.69283e-03 ± 2.52724e-02
  ADC_P1  : 8.27713e-03 ± 6.16360e-04
  ADC_P2  : -5.36304e-06 ± 2.98989e-06
  CSA_Chi2/NDF : 1.43671e-04 / 2
  CSA_P0  : 5.92076e-02 ± 7.99480e-03
  CSA_P1  : 1.01728e-02 ± 6.02351e-04
  CSA_P2  : -5.01540e-05 ± 9.17309e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [0, 22, 28, 31, 34, 36, 39, 50, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 22, 26, 65, 77, 103, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2506', '1.800', '0.1662', '1.800', '0.0849', '7.000', '0.7073', 1, 1, 1, 1, 1725020989.9803708]
VI_after__Init : ['1.201', '0.2506', '1.800', '0.1662', '1.800', '0.0795', '7.000', '0.7072', 1, 1, 1, 1, 1725020998.1727872]
VI_at__the_End : ['1.202', '0.4938', '1.800', '0.1412', '1.808', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1725021057.9192643]