TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_31_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-012-024-14 | FUSED_ID : 6359364768390758798
  IC_TEMP :  -55.21 | VDDM : 1127.94 | AUX_INT :   -9.73 | CsaBias :   81.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52843e-03 / 2
  ADC_P0  : -9.73125e-03 ± 2.65168e-02
  ADC_P1  : 8.31038e-03 ± 6.45318e-04
  ADC_P2  : -5.43216e-06 ± 3.13323e-06
  CSA_Chi2/NDF : 1.67089e-04 / 2
  CSA_P0  : 5.95139e-02 ± 8.62177e-03
  CSA_P1  : 9.97033e-03 ± 6.49588e-04
  CSA_P2  : -4.65580e-05 ± 9.89246e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [30, 68, 73, 98, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 55, 57, 61, 77, 81, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4601', '1.800', '0.1526', '1.799', '0.0918', '7.000', '0.7069', 1, 1, 1, 1, 1725021085.9382095]
VI_after__Init : ['1.202', '0.4607', '1.800', '0.1530', '1.801', '0.0859', '7.000', '0.7072', 1, 1, 1, 1, 1725021093.9174995]
VI_at__the_End : ['1.202', '0.4971', '1.800', '0.1380', '1.800', '0.1128', '7.000', '0.7079', 1, 1, 1, 1, 1725021161.2494564]