TEST_NAME : Wafer
TEST_DATE : 24_08_30-15_11_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-005-04 | FUSED_ID : 6359364768390762580
  IC_TEMP :  -51.40 | VDDM : 1126.90 | AUX_INT :   -7.35 | CsaBias :   75.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13766e-03 / 2
  ADC_P0  : -7.35360e-03 ± 2.28959e-02
  ADC_P1  : 8.28906e-03 ± 5.71211e-04
  ADC_P2  : -4.84934e-06 ± 2.82764e-06
  CSA_Chi2/NDF : 1.52408e-04 / 2
  CSA_P0  : 6.23705e-02 ± 8.23430e-03
  CSA_P1  : 1.01419e-02 ± 6.20395e-04
  CSA_P2  : -4.88425e-05 ± 9.44788e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 8, 37, 56, 68, 89, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 48, 65, 73, 75, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3355', '1.800', '0.1818', '1.800', '0.0984', '7.000', '0.7076', 1, 1, 1, 1, 1725023478.5466192]
VI_after__Init : ['1.201', '0.3356', '1.800', '0.1818', '1.800', '0.0929', '7.000', '0.7072', 1, 1, 1, 1, 1725023487.3708947]
VI_at__the_End : ['1.201', '0.5032', '1.800', '0.1400', '1.801', '0.1118', '7.000', '0.7082', 1, 1, 1, 1, 1725023547.0932784]