TEST_NAME : Wafer
TEST_DATE : 24_08_30-15_03_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-010-04 | FUSED_ID : 6359364768390762660
  IC_TEMP :  -51.64 | VDDM : 1121.28 | AUX_INT :   -9.73 | CsaBias :   81.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52843e-03 / 2
  ADC_P0  : -9.73125e-03 ± 2.65168e-02
  ADC_P1  : 8.31038e-03 ± 6.45318e-04
  ADC_P2  : -5.43216e-06 ± 3.13323e-06
  CSA_Chi2/NDF : 1.23431e-04 / 2
  CSA_P0  : 6.15889e-02 ± 7.41027e-03
  CSA_P1  : 1.01034e-02 ± 5.58310e-04
  CSA_P2  : -4.82974e-05 ± 8.50241e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [7, 19, 34, 35, 41, 65, 77, 90, 95, 106, 109, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [23, 28, 61, 75, 92, 95, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3900', '1.800', '0.1789', '1.800', '0.0933', '7.000', '0.7079', 1, 1, 1, 1, 1725023004.2564108]
VI_after__Init : ['1.201', '0.3901', '1.800', '0.1789', '1.799', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1725023012.3508081]
VI_at__the_End : ['1.202', '0.5026', '1.800', '0.1390', '1.799', '0.1122', '7.000', '0.7086', 1, 1, 1, 1, 1725023071.6871243]