TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_57_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-014-04 | FUSED_ID : 6359364768390762724
  IC_TEMP :  -54.21 | VDDM : 1119.60 | AUX_INT :   -9.13 | CsaBias :   79.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43992e-03 / 2
  ADC_P0  : -9.13158e-03 ± 2.57394e-02
  ADC_P1  : 8.13452e-03 ± 6.15157e-04
  ADC_P2  : -5.22773e-06 ± 2.92524e-06
  CSA_Chi2/NDF : 1.62960e-04 / 2
  CSA_P0  : 6.08063e-02 ± 8.51458e-03
  CSA_P1  : 1.00852e-02 ± 6.41512e-04
  CSA_P2  : -5.06382e-05 ± 9.76947e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [1, 54, 64, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 29, 31, 47, 78, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2297', '1.800', '0.1696', '1.800', '0.0335', '7.000', '0.7055', 1, 1, 1, 1, 1725022620.057243]
VI_after__Init : ['1.202', '0.2297', '1.800', '0.1696', '1.800', '0.0873', '7.000', '0.7078', 1, 1, 1, 1, 1725022628.8526208]
VI_at__the_End : ['1.201', '0.4923', '1.800', '0.1393', '1.800', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1725022696.269381]