TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_49_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-019-03 | FUSED_ID : 6359364768390762803
  IC_TEMP :  -49.55 | VDDM : 1129.95 | AUX_INT :   -8.53 | CsaBias :   87.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10231e-03 / 2
  ADC_P0  : -8.53086e-03 ± 2.24553e-02
  ADC_P1  : 8.07380e-03 ± 5.27562e-04
  ADC_P2  : -5.49514e-06 ± 2.46380e-06
  CSA_Chi2/NDF : 9.03953e-05 / 2
  CSA_P0  : 5.84815e-02 ± 6.34155e-03
  CSA_P1  : 9.84734e-03 ± 4.77790e-04
  CSA_P2  : -4.49801e-05 ± 7.27617e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 28, 33, 45, 83, 89, 108, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 21, 24, 46, 91, 101, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3189', '1.800', '0.1686', '1.800', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1725022145.420016]
VI_after__Init : ['1.201', '0.3188', '1.800', '0.1687', '1.800', '0.0859', '7.000', '0.7072', 1, 1, 1, 1, 1725022153.700392]
VI_at__the_End : ['1.202', '0.4978', '1.800', '0.1355', '1.801', '0.1099', '7.000', '0.7081', 1, 1, 1, 1, 1725022218.9302855]