TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_47_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-020-03 | FUSED_ID : 6359364768390762819
  IC_TEMP :  -54.50 | VDDM : 1132.88 | AUX_INT :   -7.39 | CsaBias :   67.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11036e-03 / 2
  ADC_P0  : -7.38948e-03 ± 2.25475e-02
  ADC_P1  : 8.35684e-03 ± 5.49183e-04
  ADC_P2  : -6.18504e-06 ± 2.63632e-06
  CSA_Chi2/NDF : 1.00298e-04 / 2
  CSA_P0  : 6.00599e-02 ± 6.67987e-03
  CSA_P1  : 9.66981e-03 ± 5.03280e-04
  CSA_P2  : -4.27910e-05 ± 7.66436e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 50, 64, 67, 120, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [5, 10, 12, 32, 64]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3354', '1.800', '0.1700', '1.800', '0.0972', '7.000', '0.7080', 1, 1, 1, 1, 1725022049.590276]
VI_after__Init : ['1.202', '0.3355', '1.800', '0.1700', '1.800', '0.0898', '7.000', '0.7072', 1, 1, 1, 1, 1725022057.6507418]
VI_at__the_End : ['1.202', '0.4960', '1.800', '0.1381', '1.800', '0.1111', '7.000', '0.7079', 1, 1, 1, 1, 1725022123.7006948]