TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_44_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-022-03 | FUSED_ID : 6359364768390762851
  IC_TEMP :  -51.21 | VDDM : 1128.28 | AUX_INT : -105.72 | CsaBias :   -9.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57339e-03 / 2
  ADC_P0  : -1.05716e-01 ± 3.24496e-02
  ADC_P1  : 9.70231e-03 ± 7.64921e-04
  ADC_P2  : -1.01334e-05 ± 3.55834e-06
  CSA_Chi2/NDF : 1.43623e-04 / 2
  CSA_P0  : 5.92728e-02 ± 7.99346e-03
  CSA_P1  : 1.01814e-02 ± 6.02250e-04
  CSA_P2  : -4.97290e-05 ± 9.17155e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [6, 10, 21, 32, 44]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [34, 40, 54, 74, 96, 115, 118, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4476', '1.800', '0.1423', '1.799', '0.1001', '7.000', '0.7069', 1, 1, 1, 1, 1725021856.380256]
VI_after__Init : ['1.202', '0.4480', '1.800', '0.1425', '1.801', '0.0942', '7.000', '0.7072', 1, 1, 1, 1, 1725021864.6806507]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1415', '1.800', '0.1121', '7.000', '0.7078', 1, 1, 1, 1, 1725021932.1814594]