TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_42_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-023-03 | FUSED_ID : 6359364768390762867
  IC_TEMP :  -55.03 | VDDM : 1129.76 | AUX_INT :   -7.41 | CsaBias :   67.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06790e-03 / 2
  ADC_P0  : -7.41417e-03 ± 2.21190e-02
  ADC_P1  : 8.33814e-03 ± 5.40463e-04
  ADC_P2  : -5.91896e-06 ± 2.60884e-06
  CSA_Chi2/NDF : 1.20890e-04 / 2
  CSA_P0  : 5.91217e-02 ± 7.33361e-03
  CSA_P1  : 9.78052e-03 ± 5.52534e-04
  CSA_P2  : -4.45003e-05 ± 8.41444e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [15, 26, 42, 51, 55, 61, 82, 92, 96, 112, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 11, 21, 79, 84, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3956', '1.800', '0.1527', '1.800', '0.0887', '7.000', '0.7070', 1, 1, 1, 1, 1725021759.8067403]
VI_after__Init : ['1.202', '0.3957', '1.800', '0.1526', '1.799', '0.0828', '7.000', '0.7070', 1, 1, 1, 1, 1725021767.8581]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1367', '1.802', '0.1112', '7.000', '0.7078', 1, 1, 1, 1, 1725021834.158992]