TEST_NAME : Wafer
TEST_DATE : 24_08_30-14_39_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-013-025-03 | FUSED_ID : 6359364768390762899
  IC_TEMP :  -48.76 | VDDM : 1131.95 | AUX_INT :   -6.73 | CsaBias :   88.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05669e-03 / 2
  ADC_P0  : -6.72841e-03 ± 2.20563e-02
  ADC_P1  : 7.98836e-03 ± 5.29891e-04
  ADC_P2  : -4.41767e-06 ± 2.53371e-06
  CSA_Chi2/NDF : 7.01936e-05 / 2
  CSA_P0  : 5.74250e-02 ± 5.58819e-03
  CSA_P1  : 9.35036e-03 ± 4.21030e-04
  CSA_P2  : -3.70491e-05 ± 6.41178e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [28, 34, 53, 57, 68, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [52, 74, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3835', '1.800', '0.1352', '1.800', '0.0896', '7.000', '0.7069', 1, 1, 1, 1, 1725021567.587525]
VI_after__Init : ['1.202', '0.3837', '1.800', '0.1351', '1.799', '0.0838', '7.000', '0.7069', 1, 1, 1, 1, 1725021576.2618616]
VI_at__the_End : ['1.202', '0.4964', '1.800', '0.1360', '1.802', '0.1087', '7.000', '0.7077', 1, 1, 1, 1, 1725021636.2832308]