TEST_NAME : Wafer
TEST_DATE : 24_08_30-15_16_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-003-10 | FUSED_ID : 6359364768390766650
  IC_TEMP :  -51.59 | VDDM : 1119.15 | AUX_INT :   -9.24 | CsaBias :   69.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54027e-03 / 2
  ADC_P0  : -9.24230e-03 ± 2.66498e-02
  ADC_P1  : 8.76337e-03 ± 6.90918e-04
  ADC_P2  : -5.75305e-06 ± 3.57027e-06
  CSA_Chi2/NDF : 1.60938e-04 / 2
  CSA_P0  : 5.59645e-02 ± 8.46158e-03
  CSA_P1  : 9.84996e-03 ± 6.37519e-04
  CSA_P2  : -4.65467e-05 ± 9.70866e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [29, 66, 112, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 8, 62, 73, 77, 79, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1259', '1.800', '0.1410', '1.800', '0.0840', '7.000', '0.7080', 1, 1, 1, 1, 1725023766.8292325]
VI_after__Init : ['1.201', '0.1258', '1.800', '0.1410', '1.801', '0.0769', '7.000', '0.7072', 1, 1, 1, 1, 1725023774.950618]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1412', '1.800', '0.1132', '7.000', '0.7079', 1, 1, 1, 1, 1725023834.8908844]