TEST_NAME : Wafer
TEST_DATE : 24_08_30-15_20_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-006-10 | FUSED_ID : 6359364768390766698
  IC_TEMP :  -54.56 | VDDM : 1132.19 | AUX_INT :   -8.67 | CsaBias :   83.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40948e-03 / 2
  ADC_P0  : -8.67073e-03 ± 2.54848e-02
  ADC_P1  : 8.42879e-03 ± 6.34526e-04
  ADC_P2  : -5.48707e-06 ± 3.14115e-06
  CSA_Chi2/NDF : 1.86743e-04 / 2
  CSA_P0  : 5.91369e-02 ± 9.11473e-03
  CSA_P1  : 1.01717e-02 ± 6.86729e-04
  CSA_P2  : -4.94222e-05 ± 1.04581e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [56, 60, 61]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [10, 17, 19, 32, 83, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2547', '1.800', '0.1763', '1.800', '0.1004', '7.000', '0.7083', 1, 1, 1, 1, 1725024055.0598905]
VI_after__Init : ['1.202', '0.2547', '1.800', '0.1763', '1.799', '0.0933', '7.000', '0.7070', 1, 1, 1, 1, 1725024063.2462492]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1413', '1.800', '0.1135', '7.000', '0.7077', 1, 1, 1, 1, 1725024130.2520716]