TEST_NAME : Wafer
TEST_DATE : 24_08_30-15_22_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-007-10 | FUSED_ID : 6359364768390766714
  IC_TEMP :  -53.10 | VDDM : 1127.27 | AUX_INT :   -7.88 | CsaBias :   75.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.67860e-04 / 2
  ADC_P0  : -7.87884e-03 ± 2.10094e-02
  ADC_P1  : 8.36318e-03 ± 5.06181e-04
  ADC_P2  : -6.44194e-06 ± 2.41000e-06
  CSA_Chi2/NDF : 1.12315e-04 / 2
  CSA_P0  : 5.96372e-02 ± 7.06872e-03
  CSA_P1  : 9.67748e-03 ± 5.32577e-04
  CSA_P2  : -4.25003e-05 ± 8.11052e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [41, 56, 67, 69, 84, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [9, 73, 104, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1836', '1.800', '0.1420', '1.800', '0.0918', '7.000', '0.7069', 1, 1, 1, 1, 1725024151.8333232]
VI_after__Init : ['1.202', '0.1837', '1.800', '0.1420', '1.801', '0.0865', '7.000', '0.7069', 1, 1, 1, 1, 1725024159.9506705]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1394', '1.803', '0.1104', '7.000', '0.7076', 1, 1, 1, 1, 1725024223.5278485]