TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_04_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-009-10 | FUSED_ID : 6359364768390766746
  IC_TEMP :  -87.42 | VDDM : 1090.64 | AUX_INT :  -10.20 | CsaBias :   50.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.81238e-03 / 2
  ADC_P0  : -1.01972e-02 ± 2.89188e-02
  ADC_P1  : 8.68294e-03 ± 7.36389e-04
  ADC_P2  : -5.85604e-06 ± 3.74350e-06
  CSA_Chi2/NDF : 1.65675e-04 / 2
  CSA_P0  : 5.71071e-02 ± 8.58521e-03
  CSA_P1  : 1.03837e-02 ± 6.46834e-04
  CSA_P2  : -7.13953e-05 ± 9.85051e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [25, 46, 51, 73, 76, 81, 82, 89, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 39, 41, 63, 89, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3629', '1.800', '0.1224', '1.800', '0.0996', '7.000', '0.7077', 1, 1, 1, 1, 1725257039.755606]
VI_after__Init : ['1.201', '0.3644', '1.800', '0.1227', '1.800', '0.0939', '7.000', '0.7076', 1, 1, 1, 1, 1725257048.4949002]
VI_at__the_End : ['1.201', '0.4247', '1.800', '0.1375', '1.808', '0.1219', '7.000', '0.7082', 1, 1, 1, 1, 1725257111.6629455]