TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_07_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-011-10 | FUSED_ID : 6359364768390766778
  IC_TEMP :  -64.72 | VDDM : 1117.59 | AUX_INT :   -9.68 | CsaBias :   63.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52866e-03 / 2
  ADC_P0  : -9.68433e-03 ± 2.65014e-02
  ADC_P1  : 8.18305e-03 ± 6.30041e-04
  ADC_P2  : -5.60432e-06 ± 2.98234e-06
  CSA_Chi2/NDF : 8.30486e-03 / 2
  CSA_P0  : 6.92161e-02 ± 6.07839e-02
  CSA_P1  : 5.43878e-03 ± 4.57963e-03
  CSA_P2  : 1.80661e-05 ± 6.97423e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [9, 34, 81, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 10, 24, 35, 39, 56]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4259', '1.800', '0.1735', '1.799', '0.0975', '7.000', '0.7074', 1, 1, 1, 1, 1725257231.9606378]
VI_after__Init : ['1.199', '0.4194', '1.800', '0.1721', '1.800', '0.0929', '7.000', '0.7076', 1, 1, 1, 1, 1725257240.8258827]
VI_at__the_End : ['1.201', '0.4659', '1.800', '0.1367', '1.799', '0.1127', '7.000', '0.7082', 1, 1, 1, 1, 1725257308.8785613]