TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_08_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-012-10 | FUSED_ID : 6359364768390766794
  IC_TEMP :  -55.90 | VDDM : 1127.34 | AUX_INT :   -9.70 | CsaBias :   82.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43431e-03 / 2
  ADC_P0  : -9.70466e-03 ± 2.56308e-02
  ADC_P1  : 8.48553e-03 ± 6.25652e-04
  ADC_P2  : -6.32720e-06 ± 3.03935e-06
  CSA_Chi2/NDF : 9.03370e-05 / 2
  CSA_P0  : 5.89906e-02 ± 6.33950e-03
  CSA_P1  : 9.68882e-03 ± 4.77636e-04
  CSA_P2  : -4.42044e-05 ± 7.27383e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [25, 75, 80, 91, 93, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 15, 37, 47, 50, 76, 98, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4432', '1.800', '0.1430', '1.799', '0.0990', '7.000', '0.7076', 1, 1, 1, 1, 1725257328.7830017]
VI_after__Init : ['1.201', '0.4435', '1.800', '0.1430', '1.800', '0.0936', '7.000', '0.7077', 1, 1, 1, 1, 1725257337.1233325]
VI_at__the_End : ['1.201', '0.4903', '1.800', '0.1387', '1.801', '0.1128', '7.000', '0.7080', 1, 1, 1, 1, 1725257405.8910935]