TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_20_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-019-13 | FUSED_ID : 6359364768390766909
  IC_TEMP :  -51.25 | VDDM : 1112.24 | AUX_INT :   -7.01 | CsaBias :   73.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01308e-03 / 2
  ADC_P0  : -7.00798e-03 ± 2.15528e-02
  ADC_P1  : 8.14916e-03 ± 5.18766e-04
  ADC_P2  : -5.44985e-06 ± 2.46612e-06
  CSA_Chi2/NDF : 9.09807e-05 / 2
  CSA_P0  : 5.88572e-02 ± 6.36205e-03
  CSA_P1  : 9.55352e-03 ± 4.79335e-04
  CSA_P2  : -4.07117e-05 ± 7.29970e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 33, 43, 64, 69, 99, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [14, 28, 30, 113, 123, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2389', '1.800', '0.1606', '1.800', '0.0800', '7.000', '0.7069', 1, 1, 1, 1, 1725258000.973909]
VI_after__Init : ['1.201', '0.2389', '1.800', '0.1606', '1.800', '0.0744', '7.000', '0.7069', 1, 1, 1, 1, 1725258009.9162252]
VI_at__the_End : ['1.201', '0.4934', '1.800', '0.1361', '1.800', '0.1106', '7.000', '0.7076', 1, 1, 1, 1, 1725258070.1425934]