TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_21_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-020-13 | FUSED_ID : 6359364768390766925
  IC_TEMP :  -50.27 | VDDM : 1127.08 | AUX_INT :   -4.72 | CsaBias :   75.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.16775e-04 / 2
  ADC_P0  : -4.72461e-03 ± 1.53469e-02
  ADC_P1  : 8.12183e-03 ± 3.70051e-04
  ADC_P2  : -5.55557e-06 ± 1.75241e-06
  CSA_Chi2/NDF : 9.67876e-05 / 2
  CSA_P0  : 5.96995e-02 ± 6.56194e-03
  CSA_P1  : 9.41041e-03 ± 4.94395e-04
  CSA_P2  : -3.90776e-05 ± 7.52905e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 11, 46, 70, 117, 120, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 12, 16, 28, 65, 77, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1857', '1.800', '0.1777', '1.800', '0.0836', '7.000', '0.7070', 1, 1, 1, 1, 1725258097.2825227]
VI_after__Init : ['1.201', '0.1858', '1.800', '0.1777', '1.800', '0.0779', '7.000', '0.7067', 1, 1, 1, 1, 1725258105.2479064]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1366', '1.804', '0.1098', '7.000', '0.7076', 1, 1, 1, 1, 1725258164.9651647]