TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_28_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-014-024-13 | FUSED_ID : 6359364768390766989
  IC_TEMP :  -52.15 | VDDM : 1130.61 | AUX_INT :   -8.60 | CsaBias :   84.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17062e-03 / 2
  ADC_P0  : -8.60345e-03 ± 2.31826e-02
  ADC_P1  : 7.77951e-03 ± 5.32604e-04
  ADC_P2  : -4.61300e-06 ± 2.43880e-06
  CSA_Chi2/NDF : 1.44674e-04 / 2
  CSA_P0  : 5.58933e-02 ± 8.02264e-03
  CSA_P1  : 1.02387e-02 ± 6.04448e-04
  CSA_P2  : -4.85534e-05 ± 9.20503e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 2, 62, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [35, 47, 53, 84, 89, 99, 102, 106, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2126', '1.800', '0.1744', '1.800', '0.0871', '7.000', '0.7069', 1, 1, 1, 1, 1725258482.7111766]
VI_after__Init : ['1.201', '0.2126', '1.800', '0.1745', '1.800', '0.0816', '7.000', '0.7067', 1, 1, 1, 1, 1725258490.9726706]
VI_at__the_End : ['1.201', '0.5019', '1.800', '0.1367', '1.802', '0.1110', '7.000', '0.7077', 1, 1, 1, 1, 1725258558.4347374]