TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_58_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-015-009-07 | FUSED_ID : 6359364768390770839
  IC_TEMP :  -53.73 | VDDM : 1128.55 | AUX_INT :   -7.75 | CsaBias :   82.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44482e-03 / 2
  ADC_P0  : -7.74989e-03 ± 2.57848e-02
  ADC_P1  : 8.28044e-03 ± 6.26838e-04
  ADC_P2  : -5.57938e-06 ± 3.02383e-06
  CSA_Chi2/NDF : 1.27982e-04 / 2
  CSA_P0  : 6.06561e-02 ± 7.54564e-03
  CSA_P1  : 9.51913e-03 ± 5.68509e-04
  CSA_P2  : -4.16156e-05 ± 8.65773e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [33, 34, 60, 62, 63, 76, 84, 86, 106, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [10, 12, 32, 35, 58, 62, 80, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3990', '1.800', '0.1413', '1.800', '0.0973', '7.000', '0.7077', 1, 1, 1, 1, 1725260302.7152503]
VI_after__Init : ['1.201', '0.3991', '1.800', '0.1413', '1.801', '0.0917', '7.000', '0.7076', 1, 1, 1, 1, 1725260310.8447025]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1377', '1.810', '0.1115', '7.000', '0.7083', 1, 1, 1, 1, 1725260377.980405]