TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_55_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-015-011-07 | FUSED_ID : 6359364768390770871
  IC_TEMP :  -54.59 | VDDM : 1116.90 | AUX_INT :   -9.47 | CsaBias :   83.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54456e-03 / 2
  ADC_P0  : -9.46779e-03 ± 2.66580e-02
  ADC_P1  : 8.47245e-03 ± 6.60125e-04
  ADC_P2  : -5.82315e-06 ± 3.25245e-06
  CSA_Chi2/NDF : 1.65331e-04 / 2
  CSA_P0  : 6.06927e-02 ± 8.57630e-03
  CSA_P1  : 1.02629e-02 ± 6.46162e-04
  CSA_P2  : -5.23592e-05 ± 9.84028e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [45, 62, 68, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 9, 12, 37, 84, 119, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3444', '1.800', '0.1237', '1.800', '0.0955', '7.000', '0.7080', 1, 1, 1, 1, 1725260110.5790825]
VI_after__Init : ['1.202', '0.3445', '1.800', '0.1236', '1.800', '0.0899', '7.000', '0.7076', 1, 1, 1, 1, 1725260119.4103684]
VI_at__the_End : ['1.202', '0.4967', '1.800', '0.1401', '1.801', '0.1126', '7.000', '0.7087', 1, 1, 1, 1, 1725260180.422719]