TEST_NAME : Wafer
TEST_DATE : 24_09_02-08_39_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-015-021-00 | FUSED_ID : 6359364768390771024
  IC_TEMP :  -52.53 | VDDM : 1127.73 | AUX_INT :   -8.88 | CsaBias :   81.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26135e-03 / 2
  ADC_P0  : -8.87756e-03 ± 2.40711e-02
  ADC_P1  : 8.23580e-03 ± 5.83832e-04
  ADC_P2  : -5.27457e-06 ± 2.82165e-06
  CSA_Chi2/NDF : 1.31164e-04 / 2
  CSA_P0  : 5.91740e-02 ± 7.63887e-03
  CSA_P1  : 1.00481e-02 ± 5.75534e-04
  CSA_P2  : -4.65803e-05 ± 8.76470e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [20, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [1, 24, 33, 42, 49, 57, 58, 69, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3203', '1.800', '0.1657', '1.799', '0.0882', '7.000', '0.7077', 1, 1, 1, 1, 1725259154.8989468]
VI_after__Init : ['1.201', '0.3203', '1.800', '0.1656', '1.800', '0.0825', '7.000', '0.7075', 1, 1, 1, 1, 1725259162.98832]
VI_at__the_End : ['1.201', '0.5033', '1.800', '0.1416', '1.802', '0.1117', '7.000', '0.7081', 1, 1, 1, 1, 1725259227.7593567]