TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_10_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-016-008-15 | FUSED_ID : 6359364768390774927
  IC_TEMP :  -50.61 | VDDM : 1125.52 | AUX_INT :   -9.11 | CsaBias :   79.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44367e-03 / 2
  ADC_P0  : -9.11085e-03 ± 2.57729e-02
  ADC_P1  : 8.13687e-03 ± 6.15957e-04
  ADC_P2  : -5.26865e-06 ± 2.92904e-06
  CSA_Chi2/NDF : 1.37136e-04 / 2
  CSA_P0  : 5.72624e-02 ± 7.81083e-03
  CSA_P1  : 1.00184e-02 ± 5.88490e-04
  CSA_P2  : -4.84223e-05 ± 8.96201e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [28, 31, 34]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [32, 47, 53, 65, 85, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2995', '1.800', '0.1499', '1.800', '0.0865', '7.000', '0.7072', 1, 1, 1, 1, 1725261055.185434]
VI_after__Init : ['1.201', '0.2995', '1.800', '0.1498', '1.801', '0.0808', '7.000', '0.7069', 1, 1, 1, 1, 1725261063.961715]
VI_at__the_End : ['1.201', '0.4902', '1.800', '0.1380', '1.804', '0.1116', '7.000', '0.7079', 1, 1, 1, 1, 1725261129.7047365]