TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_15_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-016-011-15 | FUSED_ID : 6359364768390774975
  IC_TEMP :  -48.90 | VDDM : 1138.90 | AUX_INT :   -6.43 | CsaBias :   80.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.90315e-04 / 2
  ADC_P0  : -6.43480e-03 ± 1.90160e-02
  ADC_P1  : 7.94347e-03 ± 4.47191e-04
  ADC_P2  : -5.15260e-06 ± 2.07561e-06
  CSA_Chi2/NDF : 7.58460e-05 / 2
  CSA_P0  : 5.70217e-02 ± 5.80883e-03
  CSA_P1  : 9.08899e-03 ± 4.37653e-04
  CSA_P2  : -3.39544e-05 ± 6.66494e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 19, 50, 80, 116, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [25, 30, 50, 51, 52, 90, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3385', '1.800', '0.1757', '1.799', '0.0997', '7.000', '0.7079', 1, 1, 1, 1, 1725261345.298164]
VI_after__Init : ['1.202', '0.3383', '1.800', '0.1757', '1.801', '0.0924', '7.000', '0.7068', 1, 1, 1, 1, 1725261353.394542]
VI_at__the_End : ['1.201', '0.4898', '1.800', '0.1377', '1.800', '0.1093', '7.000', '0.7076', 1, 1, 1, 1, 1725261409.6502264]