TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_57_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-017-009-02 | FUSED_ID : 6359364768390779026
  IC_TEMP :  -52.05 | VDDM : 1122.73 | AUX_INT :   -9.24 | CsaBias :   81.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33868e-03 / 2
  ADC_P0  : -9.23670e-03 ± 2.47720e-02
  ADC_P1  : 8.28961e-03 ± 5.95701e-04
  ADC_P2  : -5.82427e-06 ± 2.84987e-06
  CSA_Chi2/NDF : 1.14603e-04 / 2
  CSA_P0  : 5.82063e-02 ± 7.14036e-03
  CSA_P1  : 9.55301e-03 ± 5.37974e-04
  CSA_P2  : -3.94492e-05 ± 8.19271e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 7, 54, 64, 72, 98, 113, 117, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 4, 8, 41, 51, 82, 106, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3984', '1.800', '0.1537', '1.800', '0.0931', '7.000', '0.7074', 1, 1, 1, 1, 1725263845.5291955]
VI_after__Init : ['1.202', '0.3985', '1.800', '0.1537', '1.800', '0.0873', '7.000', '0.7073', 1, 1, 1, 1, 1725263854.3785653]
VI_at__the_End : ['1.202', '0.4948', '1.800', '0.1360', '1.800', '0.1114', '7.000', '0.7080', 1, 1, 1, 1, 1725263919.9434543]