TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_51_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-017-013-02 | FUSED_ID : 6359364768390779090
  IC_TEMP :  -57.07 | VDDM : 1127.07 | AUX_INT :   -9.45 | CsaBias :   71.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52749e-03 / 2
  ADC_P0  : -9.45125e-03 ± 2.64834e-02
  ADC_P1  : 8.18816e-03 ± 6.27667e-04
  ADC_P2  : -5.78715e-06 ± 2.95505e-06
  CSA_Chi2/NDF : 1.51690e-04 / 2
  CSA_P0  : 5.92040e-02 ± 8.21486e-03
  CSA_P1  : 1.03771e-02 ± 6.18930e-04
  CSA_P2  : -5.31159e-05 ± 9.42558e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [22, 49, 55, 68, 70, 95, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 12, 14, 30, 71, 72, 75, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2688', '1.800', '0.1432', '1.800', '0.0886', '7.000', '0.7076', 1, 1, 1, 1, 1725263461.5591474]
VI_after__Init : ['1.202', '0.2690', '1.800', '0.1432', '1.800', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1725263469.8146136]
VI_at__the_End : ['1.201', '0.4960', '1.800', '0.1373', '1.800', '0.1139', '7.000', '0.7083', 1, 1, 1, 1, 1725263528.708916]