TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_49_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-017-014-02 | FUSED_ID : 6359364768390779106
  IC_TEMP :  -49.95 | VDDM : 1127.89 | AUX_INT :   -8.86 | CsaBias :   81.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48967e-03 / 2
  ADC_P0  : -8.85729e-03 ± 2.61820e-02
  ADC_P1  : 8.29328e-03 ± 6.36494e-04
  ADC_P2  : -5.64397e-06 ± 3.07041e-06
  CSA_Chi2/NDF : 1.08318e-04 / 2
  CSA_P0  : 5.96886e-02 ± 6.94181e-03
  CSA_P1  : 9.73384e-03 ± 5.23015e-04
  CSA_P2  : -4.30720e-05 ± 7.96490e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [27, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [36, 42, 46, 84, 100, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4893', '1.800', '0.1657', '1.799', '0.0968', '7.000', '0.7087', 1, 1, 1, 1, 1725263365.0827992]
VI_after__Init : ['1.201', '0.4900', '1.800', '0.1658', '1.800', '0.0894', '7.000', '0.7077', 1, 1, 1, 1, 1725263373.2411454]
VI_at__the_End : ['1.201', '0.4989', '1.800', '0.1389', '1.802', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1725263440.0018775]