TEST_NAME : Wafer
TEST_DATE : 24_09_02-09_44_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-017-017-05 | FUSED_ID : 6359364768390779157
  IC_TEMP :  -56.45 | VDDM : 1125.32 | AUX_INT :   -6.12 | CsaBias :   75.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.14784e-04 / 2
  ADC_P0  : -6.12489e-03 ± 1.80492e-02
  ADC_P1  : 8.24126e-03 ± 4.34352e-04
  ADC_P2  : -6.07491e-06 ± 2.05691e-06
  CSA_Chi2/NDF : 1.39638e-04 / 2
  CSA_P0  : 5.97711e-02 ± 7.88177e-03
  CSA_P1  : 1.00244e-02 ± 5.93835e-04
  CSA_P2  : -4.74560e-05 ± 9.04340e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 36, 86, 97, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [12, 41, 71, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3891', '1.800', '0.1520', '1.800', '0.0925', '7.000', '0.7076', 1, 1, 1, 1, 1725263077.7974653]
VI_after__Init : ['1.201', '0.3880', '1.800', '0.1520', '1.800', '0.0875', '7.000', '0.7075', 1, 1, 1, 1, 1725263085.9509432]
VI_at__the_End : ['1.201', '0.5014', '1.800', '0.1374', '1.799', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1725263153.7253795]